Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions-Reference-Cited by-同舟云学术

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Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions

Published:2008 Issue:10 Volume:22 Page:1481-1496
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun. Mass Spectrom.

Author:

De Mondt Roel,Van Vaeck Luc,Heile Andreas,Arlinghaus Heinrich F.,Nieuwjaer Nicolas,Delcorte Arnaud,Bertrand Patrick,Lenaerts Jens,Vangaever Frank

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Reference37 articles.

1. In situ temperature-time effect on MetA-S-SIMS

2. Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition

3. Molecular secondary ion formation under cluster bombardment: A fundamental review

4. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

5. Stretching the limits of static SIMS with C60+

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Secondary Ion Mass Spectrometry;Practical Materials Characterization;2014

2. Computer Simulations of the Sputtering of Metallic, Organic, and Metal–Organic Surfaces with Bin and C60 Projectiles;The Journal of Physical Chemistry C;2013-02-04

3. TOF-SIMS imaging of adsorbed proteins on topographically complex surfaces with Bi3+ primary ions;Biointerphases;2011-09

4. Potential of nanoparticles in sample preparation;Journal of Chromatography A;2011-01

5. Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale;Analytical and Bioanalytical Chemistry;2010-03-06

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