Learning‐based mutant reduction using fine‐grained mutation operators-Reference-Cited by-同舟云学术

Learning‐based mutant reduction using fine‐grained mutation operators

Published:2021-08-08 Issue: Volume: Page:
ISSN:0960-0833
Container-title:Software Testing, Verification and Reliability
language:en
Short-container-title:Softw Test Verif Reliab

Author:

Kim Yunho¹,Hong Shin²^ORCID

Affiliation:

1. Department of Computer Science Hanyang University Seoul South Korea

2. School of Computer Science and Electrical Engineering and Department of Information and Communication Engineering Handong Global University Pohang South Korea

Funder

National Research Foundation of Korea

Institute for Information and Communications Technology Promotion

Publisher

Wiley

Subject

Safety, Risk, Reliability and Quality,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/stvr.1786

Reference40 articles.

1. An Analysis and Survey of the Development of Mutation Testing

2. On the Use of Mutation Faults in Empirical Assessments of Test Case Prioritization Techniques

3. MoonS KimY KimM YooS.Ask the mutants: Mutating faulty programs for fault localization. In 2014 IEEE Seventh International Conference on Software Testing Verification and Validation:Cleveland OH USA 2014. p.153–162.

4. Metallaxis-FL: mutation-based fault localization

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