Lifetime estimation for optocouplers using accelerated degradation test-Reference-Cited by-同舟云学术

Lifetime estimation for optocouplers using accelerated degradation test

Published:2021-10-22 Issue:1 Volume:38 Page:560-573
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Quality & Reliability Eng

Author:

Kang Minkoo¹^ORCID,Lee Sunjae²,Park Heedo²,Jang Joongsoon²,Park Sangchul²^ORCID,Kim Jong‐Ho³,Yoo Chan‐Sei⁴

Affiliation:

1. Engineering Research Institute Ajou University Suwon Korea

2. Department of Industrial Engineering Ajou University Suwon Korea

3. Woojin‐ntec. Inc. Hwasung Korea

4. Korea Electronics Technology Institute Seongnam Korea

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/qre.3001

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4. NelsonWB.An updated bibliography of accelerated test plans. In2015 Annual Reliability and Maintainability Symposium (RAMS).IEEE:Palm Harbor 2015;1‐6.

5. Accelerated Degradation Tests: Modeling and Analysis

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