Highly Robust Flexible Ferroelectric Field Effect Transistors Operable at High Temperature with Low‐Power Consumption

Author:

Ren Chuanlai12,Zhong Gaokuo2,Xiao Qun12,Tan Congbing3,Feng Ming4,Zhong Xiangli1,An Feng12,Wang Jinbin1,Zi Mengfei12,Tang Mingkai12,Tang Yong1,Jia Tingting2,Li Jiangyu2ORCID

Affiliation:

1. School of Materials Science and EngineeringXiangtan University Xiangtan 411105 China

2. Shenzhen Key Laboratory of NanobiomechanicsShenzhen Institutes of Advanced TechnologyChinese Academy of Sciences Shenzhen 518055 China

3. Department of Physics and Electronic ScienceHunan University of Science and Technology Xiangtan 411105 China

4. Key Laboratory of Functional Materials Physics and Chemistry of the Ministry of EducationJilin Normal University Changchun 130103 China

Funder

National Basic Research Program of China

National Natural Science Foundation of China

China Postdoctoral Science Foundation

Shenzhen Institutes of Advanced Technology Innovation Program for Excellent Young Researchers

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

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