Ultrasmooth and Photoresist‐Free Micropore‐Based EGaIn Molecular Junctions: Fabrication and How Roughness Determines Voltage Response-Reference-Cited by-同舟云学术

Ultrasmooth and Photoresist‐Free Micropore‐Based EGaIn Molecular Junctions: Fabrication and How Roughness Determines Voltage Response

Published:2019-07-23 Issue:38 Volume:29 Page:1904452
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Karuppannan Senthil Kumar¹,Hongting Hu¹,Troadec Cedric²,Vilan Ayelet³,Nijhuis Christian A.¹⁴^ORCID

Affiliation:

1. Department of Chemistry National University of Singapore 3 Science Drive 3 Singapore 117543 Singapore

2. Institute of Materials Research and Engineering (IMRE) Agency for Science Technology and Research (A*STAR) 2 Fusionopolis Way, #08‐03 Innovis Singapore 138634 Singapore

3. Department of Chemical and Biological Physics Weizmann Institute of Science Rehovot 76100 Israel

4. Centre for Advanced 2D Materials and Graphene Research Centre National University of Singapore 6 Science Drive 2 Singapore 117546 Singapore

Funder

Ministry of Education - Singapore

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201904452

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1. Unimolecular Electronics

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