Addressing the Reliability and Electron Transport Kinetics in Halide Perovskite Film via Pulsed Laser Engineering-Reference-Cited by-同舟云学术

Addressing the Reliability and Electron Transport Kinetics in Halide Perovskite Film via Pulsed Laser Engineering

Author:

Song Chunpeng¹,Tong Lei²³,Liu Feng¹⁴,Ye Lei²³,Cheng Gary J.¹⁵⁶^ORCID

Affiliation:

1. The Institute of Technological SciencesWuhan University Wuhan 430072 China

2. School of Optical and Electronic InformationHuazhong University of Science and Technology Wuhan Hubei 430074 China

3. Wuhan National Laboratory for Optoelectronics Wuhan Hubei 430074 China

4. School of Power and Mechanical EngineeringWuhan University Wuhan 430072 China

5. Brick Nanotechnology CenterPurdue University West Lafayette IN 47906 USA

6. School of Industrial EngineeringPurdue University West Lafayette IN 47906 USA

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

Reference40 articles.

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