Capacitance Characterization of Elastomeric Dielectrics for Applications in Intrinsically Stretchable Thin Film Transistors-Reference-Cited by-同舟云学术

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Capacitance Characterization of Elastomeric Dielectrics for Applications in Intrinsically Stretchable Thin Film Transistors

Published:2016-05-09 Issue:26 Volume:26 Page:4680-4686
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Kong Desheng¹,Pfattner Raphael¹,Chortos Alex²,Lu Chien¹,Hinckley Allison C.¹,Wang Chao¹,Lee Wen‐Ya¹,Chung Jong Won¹³,Bao Zhenan¹

Affiliation:

1. Department of Chemical Engineering Stanford University Stanford CA 94305 USA

2. Department of Materials Science and Engineering Stanford University Stanford CA 94305 USA

3. Samsung Advanced Institute of Technology Yeongtong‐gu Suwon‐si Gyeonggi‐do 443‐803 South Korea

Funder

Air Force Office of Scientific Research

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201600612

Reference43 articles.

1. Materials and Mechanics for Stretchable Electronics

2. 25th Anniversary Article: The Evolution of Electronic Skin (E-Skin): A Brief History, Design Considerations, and Recent Progress

3. Stretchable, Large-area Organic Electronics

4. Materials for stretchable electronics

5. Stretchable Figures of Merit in Deformable Electronics

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