Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up-Reference-Cited by-同舟云学术

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Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up

Published:2019-12 Issue:52 Volume:29 Page:1908267
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Kalinin Sergei V.¹,Dyck Ondrej¹

Affiliation:

1. Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA

Funder

U.S. Department of Energy

Office of Science

Basic Energy Sciences

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201908267

Reference53 articles.

1. Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking

2. A single-atom electron spin qubit in silicon

3. Graphene-based qubits in quantum communications

4. Quantum dots and spin qubits in graphene

5. Spin qubits in graphene quantum dots

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of electron-irradiation on layered quantum materials;Bulletin of Materials Science;2021-08-12

2. Quantum Interfaces to the Nanoscale;ACS Nano;2021-05-17

3. Hybridized Defects in Solid-State Materials as Artificial Molecules;ACS Nano;2021-02-18

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