Characterizing Nickel Oxide Thin Films for Smart Window Energy Conversion Applications: Combined Experimental and Theoretical Analyses

Abstract

AbstractIn this work, we have analyzed key characteristics of nickel oxide (NiO) thin films using combined experimental and computational approaches for smart window applications. Thermo Gravimetric Analysis (TGA) depicts that nickel oxide films are stable beyond 275 °C.The XRD pattern revealed the single phase of the materials. FTIR studies confirm the stretching vibrational band of Ni−O. The current‐voltage analysis shows the semiconducting behavior of the materials. The synthesized NiO thin films have shown prominent electrochromic response with a wide linear range, better cyclic stability, high durability, and fast response time. The sample having concentration of 0.05 M/25 mL has best semi‐conductive response as rapid increase in current occurs above 0.8 V. Moreover, the electrochemical and optical properties have shown reversible redox behavior of the synthesized NiO thin films with changing their appearance from original greenish gray to the dark brown in the selected potential range. In addition, the computational study has also been performed for deep study of electronic charge conduction mechanism and photo response of NiO thin layer using Tran‐Blaha modified Becke Johnson (TB‐mBJ) approach. These fabricated NiO thin films have been utilized as an active electrode for electro chromic devices in smart window applications.