Surface analysis insight note: Synthetic line shapes, integration regions and relative sensitivity factors
Author:
Affiliation:
1. Université de Nantes, CNRS, Institut des Matériaux Jean Rouxel, IMN Nantes France
2. Casa Software Ltd Teignmouth Devon UK
3. Department of Chemical and Biomolecular Engineering Lehigh University Bethlehem PA USA
Funder
Centre National de la Recherche Scientifique
U.S. Department of Energy
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7155
Reference20 articles.
1. The quantitative analysis of surfaces by XPS: A review
2. The interpretation of XPS spectra: Insights into materials properties
3. In SituX-Ray Photoelectron Spectroscopy of Model Catalysts: At the Edge of the Gap
4. X-Ray Photoelectron Spectroscopy in Electrochemistry Research
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