P‐143: TSP Pattern Design and Sensitivity Characterization via Convolutional Neural Networks-Reference-Cited by-同舟云学术

P‐143: TSP Pattern Design and Sensitivity Characterization via Convolutional Neural Networks

Published:2019-05-29 Issue:1 Volume:50 Page:1763-1766
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest of Technical Papers

Author:

Park Hyun Sung¹,Jeong Choong Min¹,Jeong Keuk Jin¹,Seo Suyul¹,Choi Yujin¹,Seo Yudeok¹,Seo Dongjin¹,Park Youngkwan¹

Affiliation:

1. Display Research Center, Samsung Display Co., Ltd. 1, Samsung-ro, Giheung-gu Yongin-si Gyeonggi-do, Korea

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.13296

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