Direct Determination of Photonic Stopband Topological Character: A Framework Based on Dispersion Measurements

Author:

Gupta Nitish Kumar1ORCID,Srinivasu Sapireddy1,Kumar Mukesh2,Tiwari Anjani Kumar3,Pal Sudipta Sarkar2,Wanare Harshawardhan14,Ramakrishna S. Anantha24

Affiliation:

1. Centre for Lasers & Photonics Indian Institute of Technology Kanpur 208016 India

2. CSIR‐Central Scientific Instruments Organisation Chandigarh 160030 India

3. Department of Physics Indian Institute of Technology Roorkee 247667 India

4. Department of Physics Indian Institute of Technology Kanpur 208016 India

Abstract

Ascertainment of photonic stopband absolute topological character requires information regarding the Bloch eigenfunction spatial distribution. Consequently, the experimental investigations predominantly restrict themselves to the bulk‐boundary correspondence principle and the ensuing emergence of topological surface state. Although capable of establishing the equivalence/inequivalence of bandgaps, the determination of their absolute topological identity remains out of its purview. The alternate method of reflection phase‐based identification also provides only contentious improvements owing to the measurement complexities pertaining to the interferometric setups. To circumvent these limitations, the Kramers–Kronig amplitude‐phase causality considerations are resorted to and an experimentally conducive method is proposed for bandgap topological character determination directly from the parametric reflectance measurements. Particularly, it is demonstrated that in case of 1D photonic crystals, polarization‐resolved dispersion measurements suffice in qualitatively determining bandgaps’ absolute topological identities. By invoking the translational invariance of the investigated samples, a parameter “differential effective mass” is also defined, that encapsulates bandgaps’ topological identities and engenders an experimentally discernible bandgap classifier.

Publisher

Wiley

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