Raman scattering measurements of phonon anharmonicity in the delafossite CuGa 1‐ x Cr x O 2 (0 ≤ x ≤ 1) films-Reference-Cited by-同舟云学术

Raman scattering measurements of phonon anharmonicity in the delafossite CuGa 1‐ x Cr x O 2 (0 ≤ x ≤ 1) films

Published:2020-02-12 Issue:5 Volume:51 Page:851-859
ISSN:0377-0486
Container-title:Journal of Raman Spectroscopy
language:en
Short-container-title:J Raman Spectrosc

Author:

Han Meijie¹²^ORCID,Lu Yonggeng¹,Liu Yonghui¹,Hu Zhigao²³,Chen Guochu¹,Jiang Kai²,Zhang Jinzhong²,Li Wenwu²

Affiliation:

1. School of Electrical Engineering Shanghai Dianji University Shanghai China

2. Technical Center for Multifunctional Magneto‐Optical Spectroscopy (Shanghai), Department of Materials, School of Physics and Electronic Science East China Normal University Shanghai China

3. Collaborative Innovation Center of Extreme Optics, Shanxi University Taiyuan Shanxi China

Funder

Fundamental Research Funds for Central Universities of the Central South University

Innovative Research Group Project of the National Natural Science Foundation of China

Publisher

Wiley

Subject

Spectroscopy,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jrs.5842

Reference41 articles.

1. Avalanche multiplication in AlGaN-based heterostructures for the ultraviolet spectral range

2. Solution-processed inorganic p-channel transistors: Recent advances and perspectives

3. Energy band engineering and controlled p‐type conductivity of CuAlO2 thin films by nonisovalent Cu‐O alloying

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