Applications of X‐Ray‐Based Characterization in MXene Research

Author:

Zhang Jizhen12ORCID,Usman Ken Aldren S.1ORCID,Judicpa Mia Angela N.1ORCID,Hegh Dylan1ORCID,Lynch Peter A.12ORCID,Razal Joselito M.1ORCID

Affiliation:

1. Institute for Frontier Materials Deakin University Geelong VIC 3216 Australia

2. Manufacturing Commonwealth Scientific and Industrial Research Organization (CSIRO) Waurn Ponds VIC 3216 Australia

Abstract

AbstractX‐rays are a penetrating form of high‐energy electromagnetic radiation with wavelengths ranging from 10 pm to 10 nm. Similar to visible light, X‐rays provide a powerful tool to study the atoms and elemental information of objects. Different characterization methods based on X‐rays are established, such as X‐ray diffraction, small‐ and wide‐angle X‐ray scattering, and X‐ray‐based spectroscopies, to explore the structural and elemental information of varied materials including low‐dimensional nanomaterials. This review summarizes the recent progress of using X‐ray related characterization methods in MXenes, a new family of 2D nanomaterials. These methods provide key information on the nanomaterials, covering synthesis, elemental composition, and the assembly of MXene sheets and their composites. Additionally, new characterization methods are proposed as future research directions in the outlook section to enhance understanding of MXene surface and chemical properties. This review is expected to provide a guideline for characterization method selection and aid in precise interpretation of the experimental data in MXene research.

Funder

Australian Research Council

Australian National Fabrication Facility

Publisher

Wiley

Subject

General Materials Science,General Chemistry

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