A novel test method for quantifying cracking propensity of photovoltaic backsheets after ultraviolet exposure-Reference-Cited by-同舟云学术

A novel test method for quantifying cracking propensity of photovoltaic backsheets after ultraviolet exposure

Published:2018-07-24 Issue:1 Volume:27 Page:44-54
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog Photovolt Res Appl

Author:

Lin Chiao‐Chi¹²^ORCID,Lyu Yadong¹,Jacobs Deborah S.¹,Kim Jae Hyun¹,Wan Kai‐Tak³,Hunston Donald L.¹,Gu Xiaohong¹

Affiliation:

1. Polymeric Materials Group, Engineering Laboratory National Institute of Standards and Technology (NIST) Gaithersburg MD 20899 USA

2. Department of Materials Science and Engineering Feng Chia University Taichung 40724 Taiwan

3. Department of Mechanical and Industrial Engineering Northeastern University Boston MA 02115 USA

Funder

National Institute of Standards and Technology

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pip.3038

Reference48 articles.

1. FelderTC GambogiWJ PhillipsN MacMasterSW YuB‐L TroutTJ.Comparison of higher irradiance and black panel temperature UV backsheet exposures to field performance. in Proc SPIE San Diego Ca2017;10370: 1037002.

2. Delamination behaviour of multi-layer films for PV encapsulation

3. Moisture transport, adhesion, and corrosion protection of PV module packaging materials

4. Correlation of the loss in photovoltaic module performance with the ageing behaviour of the backsheets used

5. A Comparison of Key PV Backsheet and Module Performance from Fielded Module Exposures and Accelerated Tests

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