Affiliation:
1. Department of Physics and Nanotechnology Faculty of Engineering and Technology SRM Institute of Science and Technology SRM Nagar, Kattankulathur Chengalpattu 603203 India
2. Computer, Electrical and Mathematical Sciences and Engineering Division (CEMSE) King Abdullah University of Science and Technology (KAUST) Thuwal 23955‐6900 Kingdom of Saudi Arabia
3. Department of Electronics and Communication Engineering Indian Institute of Information Technology Design and Manufacturing (IIITDM) Kurnool Andhra Pradesh 518008 India
Abstract
This study presents an early exploration into the application of a self‐powered photodetector based on titanium zinc nitride (TiZnN) films in power electronics, aiming to overcome inherent limitations of conventional optocouplers such as low switching speed and specific operating voltage requirements. The fabricated device demonstrates excellent performance metrics, including photosensitivity of 136, the responsivity of 3.22 mA W−1 at −8 V bias, and a peak detectivity of 1.76 × 108 Jones at 0 V bias. Remarkably, ultrafast rise (τs) and decay times (τd) of 0.11 and 0.10 ms, respectively, are achieved, alongside broad‐band spectral absorption characteristics. Experimental validation showcases the efficacy of the TiZnN‐based optocoupler in practical applications, notably in power electronics triggerable relay systems and AC–AC converters. Leveraging the self‐powering capability inherent to the TiZnN photodetector, this optocoupler eliminates external power source dependencies, thereby enhancing its versatility and applicability in diverse electronic systems. The rapid response time of the device and broad spectral absorption further underscore its suitability for high‐speed signal transmission across varied operating conditions. This research paves a path for developing stable, cost‐effective, and self‐powered ultrafast optocouplers, eliminating concerns about compromising electrical signal transit. These advancements hold significant implications for enhancing electronic system performance, reliability, and functionality in critical applications.
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