Author:
Culpo Massimiliano,de Falco Carlo
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics
Reference8 articles.
1. P. Igic P. Mawby M. Towers S. Batcup Semiconductor Thermal Measurement and Management, 2001. Seventeenth Annual IEEE Symposium pp.35-42 (2001).
2. V. Szekely A. Poppe A. Pahi A. Csendes G. Hajas M. Rencz Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 5(3), 258-269 (Sep 1997).
3. A. Hefner D. Blackburn Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on [see also Components, Hybrids, and Manufacturing Technology, IEEE Transactions on] 17(3), 413-424 (Sep 1994).
4. S. Wunsche C. Clauss P. Schwarz F. Winkler Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 5(3), 277-282 (Sep 1997).
5. C.W. Ho A. Ruehli P. Brennan Circuits and Systems, IEEE Transactions on 22(6), 504-509 (Jun 1975).
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