Selective X-ray analysis of electron localizing sites using capacitance or electrostatic force-Reference-Cited by-同舟云学术

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Selective X-ray analysis of electron localizing sites using capacitance or electrostatic force

Published:2009-03 Issue:3 Volume:92 Page:38-45
ISSN:1942-9533
Container-title:Electronics and Communications in Japan
language:en
Short-container-title:Electron. Comm. Jpn.

Author:

Ishii Masashi

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Networks and Communications,General Physics and Astronomy,Signal Processing

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/ecj.10016/fullpdf

Reference17 articles.

1. Selective X-ray absorption spectroscopy of self-assembled atom in InAs quantum dot;Ishii;Microelectron Eng,2003

2. Site-selective X-ray absorption fine structure: Selective observation of Ga local structure in DX center of Al0.33Ga0.67As:Se;Ishii;Appl Phys Lett,1999

3. X-ray absorption fine structure measurement using parallel plate capacitor: Observation of surface electronic states of metals;Ishii;Rev Sci Instrum,2005

4. X-ray absorption microspectroscopy using Kelvin force microscopy with x-ray source;Ishii;Physica B,2006

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