Affiliation:
1. Advanced Analysis Center; Korea Institute of Science and Technology; Seoul 136-791 Korea
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Cited by
6 articles.
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1. Influence of temperature and sputter source on Cu(In,Ga)Se
2
SIMS depth profiles;Surface and Interface Analysis;2022-11-02
2. Comparison of quantitative elemental depth distribution analyses of Ni and Ti in co-sputtered Ni-Ti alloy thin films using MCs+ and M+ secondary ions;Thin Solid Films;2022-07
3. Complementary Characterization of Cu(In,Ga)Se2 Thin-Film Photovoltaic Cells Using Secondary Ion Mass Spectrometry, Auger Electron Spectroscopy, and Atom Probe Tomography;Journal of Nanoscience and Nanotechnology;2018-05-01
4. Secondary ion mass spectrometry as a tool to study selenium gradient in Cu
2
ZnSn(S,Se)
4;physica status solidi c;2017-02-21
5. Structural and compositional analyses of Cu(In,Ga)Se2 thin film solar cells with different cell performances;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-05