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Probe current determination in analytical TEM/STEM and its application to the characterization of large area EDS detectors

  • Published:2015-08-11 Issue:10 Volume:78 Page:886-893
  • ISSN:1059-910X
  • Container-title:Microscopy Research and Technique
  • language:en
  • Short-container-title:Microsc. Res. Tech.

Author:

Mitchell David R.G.1,Nancarrow Mitchell J.B.1

Affiliation:

1. Electron Microscopy Centre, Innovation Campus, University of Wollongong; Squires Way North Wollongong New South Wales 2500 Australia

Funder

Australian Research Council (ARC)-Linkage, Infrastructure, Equipment and Facilities (LIEF)

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference19 articles.

1. Bai X-C Fernandez IS McMullan G Scheres SHW. 2013 1 12

2. Cryo-electron microscopy of vitrified specimens;Dubochet;Quart Rev Biophys,1988

3. Characterization of an analytical electron microscope with a NiO test specimen;Egerton;Ultramicroscopy,1994

4. Radiation damage in the TEM and SEM;Egerton;Micron,2004
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