Generalized Linear Model-based Control Charts for Discrete Semiconductor Process Data-Reference-Cited by-同舟云学术

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Generalized Linear Model-based Control Charts for Discrete Semiconductor Process Data

Published:2004 Issue:8 Volume:20 Page:777-786
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Qual. Reliab. Engng. Int.

Author:

Skinner Katina R.,Montgomery Douglas C.,Runger George C.

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference12 articles.

1. A review of multivariate control charts

2. Quality Control Methods for Multivariate Binomial and Poisson Distributions

3. Filtering and smoothing methods for mixed particle count distributions

4. Process monitoring for multiple count data using generalized linear model-based control charts

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