Nanoprofiles evaluation of ZnO thin films by an evanescent light method
Author:
Affiliation:
1. EE Department; Holon Institute of Technology; Holon Israel 58102
2. Lasers Department; National Institute for Lasers, Plasma and Radiation Physics; RO-77125 Bucharest-Magurele Romania
Funder
PN-II-ID
Publisher
Wiley
Subject
Medical Laboratory Technology,Instrumentation,Histology,Anatomy
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/jemt.22259/fullpdf
Reference17 articles.
1. The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method;Caglar;J Optoelectron Adv Mater,2006
2. ZnO Thin Films Deposited on Textile Material Substrates for Biomedical Applications
3. Total internal reflection microscopy with a multilayered interface: A light scattering model based on a discrete sources method;Eremina;J Opt A: Pure Appl Opt,2006
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