A method for structure analysis of nanomaterials by electron diffraction: Phase identification and unit cell determination-Reference-Cited by-同舟云学术

A method for structure analysis of nanomaterials by electron diffraction: Phase identification and unit cell determination

Published:2013-03-30 Issue:6 Volume:76 Page:641-647
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

Honglong Shi¹,Guling Zhang¹,Bin Zou¹,Minting Luo²,Wenzhong Wang¹

Affiliation:

1. School of science; Minzu University of China; Beijing; 100081; People's Republic of China

2. The National Engineering Laboratory for Hydrometallurgical Cleaner Production Technology; Institute of Process Engineering; Chinese Academy of Sciences; People's Republic of China

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference27 articles.

1. Lithium Storage in Amorphous TiO2 Nanoparticles;Borghols;J Electrochem Soc,2010

2. Dendrimer-encapsulated metal nanoparticles: Synthesis, characterization, and applications to catalysis;Crooks;Acc Chem Res,2001

3. Quantitative local profile analysis of nanomaterials by electron diffraction;Gammer;Scripta Mater,2010

4. Nanomaterial for high-density magnetic data storage;Gubin;Russ J Inorg Chem,2002

5. A review of TiO2 nanoparticles;Gupta;Chin Sci Bull,2011

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automating selective area electron diffraction phase identification using machine learning;Journal of Materiomics;2024-07

2. Reduction of graphene oxide by in-situ heating experiments in the transmission electron microscope;Surfaces and Interfaces;2022-12

3. Deterioration mechanism of vanadium dioxide smart coatings during natural aging: Uncovering the role of water;Chemical Engineering Journal;2022-11

4. Acquisition and evaluation procedure to improve the accuracy of SAED;Microscopy Research and Technique;2022-09-07

5. Layer-Dependent Band Structure of Ternary Metal Chalcogenides: Thickness-Controlled Hexagonal FeIn2S4;Chemistry of Materials;2020-12-30