Low‐Temperature Melt Processing Monolithic Integration of Organic Manganese (II) Bromide Wafers with Pixelated Substrate for High Sensitivity X‐Ray Imaging-Reference-Cited by-同舟云学术

Low‐Temperature Melt Processing Monolithic Integration of Organic Manganese (II) Bromide Wafers with Pixelated Substrate for High Sensitivity X‐Ray Imaging

Published:2022-09-25 Issue:48 Volume:32 Page:2208199
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv Funct Materials

Author:

Li Hengxin¹,Lei Yutian¹,Peng Guoqiang¹,Wang Qian¹,Li ZhenHua²,Wang Haoxu¹,Wang Gang³,Jin Zhiwen¹^ORCID

Affiliation:

1. School of Physical Science and Technology & Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education Lanzhou University Lanzhou 730000 China

2. School of Physical Science and Technology & Lanzhou Center for Theoretical Physics & Key Laboratory of Theoretical Physics of Gansu Province Lanzhou University Lanzhou 730000 China

3. Department of Microelectronic Science and Engineering School of Physical Science and Technology Ningbo University Ningbo 315211 China

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.202208199

Reference54 articles.

1. Solvent Free Laminated Fabrication of Lead Halide Perovskites for Sensitive and Stable X-ray Detection