Dense Stacking of Millimeter‐Sized Perovskite Single Crystals for Sensitive and Low‐Bias Hard X‐Ray Detection

Abstract

AbstractMetal halide perovskite single crystals are promising for hard X‐ray detection, but growth of large‐sized thin single crystals and inhibition of halide ion migration under high bias are challenging. Herein, the preparation of dense stacking of oriented millimeter‐sized perovskite single crystals with capability of large‐area fabrication, controlled thickness, and high ion migration activation energy (Ea)is reported. The oriented growth results in absence of grain boundaries parallel with the substrates, leading to large carrier mobility‐lifetime (µτ) product of 2.7 × 10−3 cm2 V−1, which is comparable to values of many perovskite bulk single crystals. Under low bias, hard X‐ray detectors exhibit high sensitivity of 1.2 × 104 µC Gy−1 cm−2 and low detection limit of 87.5 nGy s−1, which are comparable to those of many single‐crystal hard X‐ray detectors under high bias. Moreover, combination of low bias and high Ea results in weak halide ion migration and small dark current drift of 3.2 × 10−4 nA cm−1 s−1 v−1. Benefited from the superior detector performance, high‐contrast hard X‐ray imaging can be obtained at a low dose rate of 1.26 µGy s−1. The work may promote the application of perovskite hard X‐ray detectors in practical imaging area.