Antisite Defects Stabilized by Antiphase Boundaries in YFeO 3 Thin Films-Reference-Cited by-同舟云学术

Antisite Defects Stabilized by Antiphase Boundaries in YFeO 3 Thin Films

Published:2021-11-16 Issue: Volume: Page:2107017
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv Funct Materials

Author:

Kumar Abinash¹,Klyukin Konstantin¹,Ning Shuai¹,Ozsoy‐Keskinbora Cigdem²,Ovsyanko Mikhail²,van Uden Felix²,Krijnen Ruud²,Yildiz Bilge¹³,Ross Caroline A.¹,LeBeau James M.¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering Massachusetts Institute of Technology Cambridge MA 02139 USA

2. Transmission Electron Microscopy Division Thermo Fisher Scientific Eindhoven 5651GG Netherlands

3. Department of Nuclear Science and Engineering Massachusetts Institute of Technology Cambridge MA 02139 USA

Funder

Microelectronics Advanced Research Corporation

National Science Foundation

Nvidia

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.202107017

Reference33 articles.

1. The multiferroic perovskite YFeO3

2. The multiferroic epitaxial thin film YFeO 3

3. An antisite defect mechanism for room temperature ferroelectricity in orthoferrites

4. Microstructure and self-exchange coupling in a YFeO3 film

5. Direct Observation of Ferrielectricity at Ferroelastic Domain Boundaries in CaTiO3by Electron Microscopy

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