Affiliation:
1. National‐Local Joint Engineering Laboratory of New Energy Photoelectric Devices College of Physics Science and Technology Hebei University Baoding 071002 P. R. China
2. Hefei National Research Center for Physical Sciences at the Microscale CAS Key Laboratory of Materials for Energy Conversion School of Chemistry and Materials Science University of Science and Technology of China Hefei Anhui 230026 P. R. China
Abstract
AbstractDeep‐level defects in semiconductor materials usually induce carrier trapping and non‐radiative recombination. However, defects caused by unintentional contaminants in antimony selenide (Sb2Se3) solar cells have rarely been reported. Herein, the correlation between defect properties and unintentional impurities in the Sb2Se3 absorber is investigated, which is prepared by injection vapor deposition with Sb2Se3 source purities ranging from 99.9% to 99.9999%. The analysis of deep‐level transient spectra reveals that an increase in impurity concentration does not result in new defect types. Nevertheless, the higher impurity level causes an increase in both the defect density and the capture cross section of the original defect. To address this challenge, defect engineering is developed to regulate the growth of the Sb2Se3 absorber. This strategy completely suppresses deepest defect states E3, a mixture of intrinsic defect (SbSe) and impurity Si related defect. As a result, the carrier lifetime increases significantly from 0.37 to 3.4 ps. This enables to fabricate Sb2Se3 solar cells with a power conversion efficiency of 10.41%. This work uncovers the characteristics of unintentional contaminant‐related defects, and provides a strategy for fabricating highly efficient Sb2Se3 solar cells with low‐purity source materials.
Funder
National Key Research and Development Program of China
National Natural Science Foundation of China