High Mobility Amorphous Polymer‐Based 3D Stacked Pseudo Logic Circuits through Precision Printing

Author:

Kim Woojo1ORCID,Ryu Gyungin1,Nam Youhyun2,Choi Hyeonmin2,Wang Meng34,Kwon Jimin5,Nielsen Christian B.3ORCID,Kang Keehoon267ORCID,Jung Sungjune18ORCID

Affiliation:

1. Department of Materials Science and Engineering Pohang University of Science and Technology (POSTECH) 67 Cheongam‐Ro, Nam‐Gu Pohang 37673 Republic of Korea

2. Department of Materials Science and Engineering Seoul National University 1 Gwanak‐Ro, Gwanak‐Gu Seoul 08826 Republic of Korea

3. Department of Chemistry Queen Mary University of London Mile End Road London E1 4NS UK

4. i‐Lab & Printable Electronics Research Center Suzhou Institute of Nano‐Tech and Nano‐Bionics Chinese Academy of Sciences 398 Ruoshui Road, SEID, SIP Suzhou 215123 China

5. Department of Electrical Engineering Ulsan National Institute of Science and Technology (UNIST) 50 UNIST‐Gil, Ulju‐Gun Ulsan 44919 Republic of Korea

6. Research Institute of Advanced Materials Seoul National University 1 Gwanak‐Ro, Gwanak‐Gu Seoul 08826 Republic of Korea

7. Institute of Applied Physics Seoul National University 1 Gwanak‐Ro, Gwanak‐Gu Seoul 08826 Republic of Korea

8. Institute for Convergence Research and Education in Advanced Technology Yonsei University 50 Yonsei‐ro, Seojaemun‐gu Seoul 03722 Republic of Korea

Abstract

AbstractDirect printing of conjugated polymer thin‐film transistors enables the fabrication of deformable devices with low cost, high throughput, and large area. However, a relatively poor device performance of printed devices remains a major obstacle to their application in high‐end display backplanes and integrated circuits. In this study, high‐performance and highly stackable printed organic transistors is developed, arrays, and circuits using a near‐amorphous polymer, indacenodithiophene‐co‐benzothiadiazole (IDT‐BT). The printed devices exhibited high saturation mobility (>1 cm2 V−1 s−1), high on/off ratio (>107), and low subthreshold slope (245 mV dec−1). In addition, 16 × 16 printed IDT‐BT arrays achieved 100% fabrication yield, with excellent device‐to‐device uniformity and low variations of mobility (9.55%) and threshold voltage (4.51%), and good operational and environmental stability (>365 days). Furthermore, five stacked 3D transistors are demonstrated with an excellent 3D uniformity without compromising device performance due to a low required thermal budget for processing amorphous IDT‐BT. Finally, a new concept of 3D universal logic gate with high voltage gain (33.91 V/V) and record density (100 printed transistors per cm2) is proposed and fabricated, which is relevant for the commercialization of low‐cost printed display backplanes and high‐density integrated circuits based on highly processable polymeric semiconductors.

Funder

National Research Foundation of Korea

Engineering and Physical Sciences Research Council

Publisher

Wiley

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