In-situ monitoring of laser annealing by micro-Raman spectroscopy for hydrogenated silicon nanoparticles produced in radio frequency glow discharge-Reference-Cited by-同舟云学术

In-situ monitoring of laser annealing by micro-Raman spectroscopy for hydrogenated silicon nanoparticles produced in radio frequency glow discharge

Published:2006-05 Issue:6 Volume:203 Page:1296-1300
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Hill D.,Jawhari T.,Cespedes J. García,García J. Alvarez,Bertran E.

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Effect of small crystal size and surface temperature on the Raman spectra of amorphous and nanostructured Si thin films deposited by radiofrequency plasmas

2. Enhanced-Raman scattering from silicon nanoparticle substrates

3. Synthesis of nanocrystalline Si particles from a solid-state reaction during a ball-milling process

4. Combined growth of Si nanoparticles and crystallized silicon layers at 200°C by reactive magnetron sputtering

5. Fabrication of silicon nanostructured films by deposition of size-selected nanoparticles generated by pulsed laser ablation

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