Direct comparison of photoluminescence lifetime and defect densities in ZnO epilayers studied by time-resolved photoluminescence and slow positron annihilation techniques-Reference-Cited by-同舟云学术

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Direct comparison of photoluminescence lifetime and defect densities in ZnO epilayers studied by time-resolved photoluminescence and slow positron annihilation techniques

Published:2004-09 Issue:12 Volume:201 Page:2841-2845
ISSN:0031-8965
Container-title:phys. stat. sol. (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Koida T.,Uedono A.,Tsukazaki A.,Sota T.,Kawasaki M.,Chichibu S. F.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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