X-ray diffuse-scattering study of defects in α-sapphire-Reference-Cited by-同舟云学术

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X-ray diffuse-scattering study of defects in α-sapphire

Published:2006-12 Issue:15 Volume:203 Page:3633-3639
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Gronkowski Jerzy,Borowski Janusz,Zielińska-Rohozińska Elżbieta,Kowalska Małgorzata,Pakuła Krzysztof

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. X-Ray Studies of Dislocation Structures in a Sapphire Crystal

2. The study of basal dislocations in sapphire

3. Dislocation behaviour in sapphire single crystals

4. Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography

5. Determination of the Burgers vector of perfect dislocations observed by X-ray topography in hexagonal single crystals

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