1. R. P. Feynman Annual Meeting of American Physical Society, 1959 [Caltech Engineering and Science journal, 4, 1(1960)]
2. J. Narayan Y. Chen R. M. Moon Phys. Rev. Lett. 46, 149(1981);
3. J. Narayan and Y. Chen, US Patent 4,376,755(1983)
4. Critical Size for Defects in Nanostructured Materials;Narayan;J. Appl. Phys.,2006