Author:
Perruchot Christian,Watts John F.,Lowe Chris,White Richard G.,Cumpson Peter J.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference23 articles.
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4. Comparison of the Tougaard, ARXPS, RBS and ellipsometry methods to determine the thickness of thin SiO2 layers
5. Determination of overlayer thickness by QUASES analysis of photon-excited KLL Auger spectra of Ni and Cu films
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