Characteristics of rare earth (RE = Eu, Tb, Tm)-doped Y2O3 phosphors for thermometry
Author:
Publisher
Wiley
Subject
Chemistry (miscellaneous),Biophysics
Reference30 articles.
1. Remote thermometry with thermographic phosphors: instrumentation and applications;Allison;Rev Sci Instrum,1997
2. Thermographic phosphor thermometry for film cooling studies in gas combustors;Feist;Proc Inst Mech Engrs Pt A: J Power Eng,2003
3. Temperature measurements of combustible and non-combustible surfaces using laser induced photoluminescence;Omrane;Exp Therm Fluid Sci,2004
4. Two-dimensional gas phase temperature measurements using phosphor thermometry;Hasegawa;Appl Phys B Laser Opt,2007
5. Simultaneous 2D flow velocity and gas temperature measurements using thermographic;Omrane;Appl Phys B,2008
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