The relationship between patterns of negative life experiences and clinical presentation in a psychiatric sample

Abstract

AbstractBackgroundAttempts have been made to classify the patterns of polytraumatization using a person‐centered approach. However, most studies have only focused on maltreatment and interpersonal trauma and have been unable to examine various clinical symptoms.ObjectivesThis study aimed to explore patterns of negative life experiences, including maltreatment, lifetime trauma, and recent stressful life events, and compare diverse dimensions of the clinical manifestations among the subtypes in a clinical sample.MethodWe investigated childhood maltreatment, lifetime trauma, and recent stressful events using a self‐report method in 1410 psychiatric patients; we classified the patterns of lifelong negative life experiences using latent profile analysis (LPA). We used the rates of psychiatric diagnosis, the Beck Depression Inventory, the Impact of Event Scale‐Revised (IES‐R‐K), and the Multiphasic Minnesota Personality Inventory‐2‐Restructured Form to compare various symptom dimensions among the derived subtypes.ResultsLPA indicated a four‐class solution: mild, recent stress, maltreatment, and multiple adversity group. The multiple adversity group experiencing both lifetime trauma and recent stressful life events, in addition to maltreatment, including sexual abuse, had a high rate of severe mental illness and more symptom dimensions of thought and behavior problems. However, the rates of depressive disorders and emotional/internalizing symptoms were not more than those in the other two groups (recent stress and maltreatment groups) experiencing moderate levels of lifetime trauma. There was no significant difference between the recent stress and maltreatment groups for most symptom dimensions.ConclusionsThe findings indicate that distinct symptom profiles may be associated with the pattern of negative experiences, suggesting that negative experiences need multidimensional investigation in clinical settings.