Versatile IR Spectroscopy Combined with Synchrotron XAS–XRD: Chemical, Electronic, and Structural Insights during Thermal Treatment of MOF Materials-Reference-Cited by-同舟云学术

Versatile IR Spectroscopy Combined with Synchrotron XAS–XRD: Chemical, Electronic, and Structural Insights during Thermal Treatment of MOF Materials

Published:2018-05-04 Issue:17 Volume:2018 Page:1847-1853
ISSN:1434-1948
Container-title:European Journal of Inorganic Chemistry
language:en
Short-container-title:Eur. J. Inorg. Chem.

Author:

Hinokuma Satoshi¹²^ORCID,Wiker Geir³,Suganuma Takuya⁴,Bansode Atul⁵,Stoian Dragos³,Huertas Silvia Caminero⁵,Molina Sonia⁵,Shafir Alexandr⁵,Rønning Magnus⁶^ORCID,van Beek Wouter³,Urakawa Atsushi⁵⁷^ORCID

Affiliation:

1. Department of Applied Chemistry and Biochemistry Graduate School of Science and Technology Kumamoto University 2‐39‐1 Kurokami, Chuo‐ku 860‐8555 Kumamoto Japan

2. International Research Organization for Advanced Science and Technology Kumamoto University 860‐8555 Kumamoto Japan

3. The Swiss‐Norwegian Beamlines (SNBL) at ESRF BP 220 38043 Grenoble France

4. Toyota Motor Corporation 1200 Mishuku, Susono Shizuoka Japan

5. Institute of Chemical Research of Catalonia (ICIQ) The Barcelona Institute of Science and Technology Av. Països Catalans 16 43007 Tarragona Spain

6. Department of Chemical Engineering Norwegian University of Science and Technology 7491 Trondheim Norway

7. JST, PRESTO 4‐1‐8 Honcho Kawaguchi 332‐0012 Saitama Japan

Funder

Precursory Research for Embryonic Science and Technology

Ministerio de Economía y Competitividad

Generalitat de Catalunya

Publisher

Wiley