Zn-aided defect control for ultrathin GZO films with high carrier concentration aiming at alternative plasmonic metamaterials-Reference-Cited by-同舟云学术

Zn-aided defect control for ultrathin GZO films with high carrier concentration aiming at alternative plasmonic metamaterials

Published:2015-02-06 Issue:8 Volume:212 Page:1713-1718
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Zhu Chaoting¹,Li Jia¹,Yang Ye¹,Huang Jinhua¹,Lu Yuehui¹,Tan Ruiqin²,Dai Ning³,Song Weijie¹

Affiliation:

1. Ningbo Institute of Material Technology and Engineering; Chinese Academy of Sciences; Ningbo 315201 P.R. China

2. College of Information Science and Engineering; Ningbo University; Ningbo 315201 P.R. China

3. National Laboratory for Infrared Physics; Shanghai Institute of Technical Physics; Chinese Academy of Sciences; Shanghai 200083 P.R. China

Funder

National Natural Science Foundation of China

Ningbo Natural Science Foundation

National Basic Research Program of China

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201431765/fullpdf

Reference29 articles.

1. Negative Refraction Makes a Perfect Lens

2. Channel plasmon subwavelength waveguide components including interferometers and ring resonators

3. Controlling Electromagnetic Fields

4. Negative Refractive Index at Optical Wavelengths

5. Alternative Plasmonic Materials: Beyond Gold and Silver

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