High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors

Author:

Chernykh Sergey V.1,Chernykh Alexey V.1,Tarelkin Sergey A.12,Kondakov Mikhail N.1,Shcherbachev Kirill D.1,Trifonova Ekaterina V.1,Drozdova Taisia E.2,Troschiev Sergey Yu.23,Prikhodko Dmitry D.24,Glybin Yury N.5,Chubenko Alexander P.16,Britvich Gennady I.17,Kiselev Dmitry A.1,Polushin Nikolay I.1,Rabinovich Oleg I.1ORCID,Didenko Sergey I.1

Affiliation:

1. National University of Science and Technology “MISiS” P.O. Box 409 119313 Moscow Russian Federation

2. Technological Institute for Superhard and Novel Carbon Materials 7a Tsentralnaya st., Troitsk 108840 Moscow Russia

3. The All-Russian Research Institute for Optical and Physical Measurements 46 Ozernaya st. 119361 Moscow Russia

4. Moscow Institute of Physics and Technology 9 Institutskiy per., Dolgoprudny 141701 Moscow Russia

5. SNIIP-Plus Co. Ltd. 5 Raspletina st. 123060 Moscow Russia

6. P. N. Lebedev Physical Institute of the Russian Academy of Sciences 53 Leninskiy Prospekt 119991 Moscow Russia

7. Institute for High-Energy Physics (IHEP) in National Research Center «Kurchatov Institute» 1 Nauki Square, Protvino Moscow Region 142281 Russia

Funder

Ministry of Education and Science of the Russian Federation

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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