Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures-Reference-Cited by-同舟云学术

Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures

Published:2010-12-22 Issue:3 Volume:208 Page:596-599
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Eyben Pierre,Seidel Felix,Hantschel Thomas,Schulze Andreas,Lorenz Anne,De Castro Angel Uruena,Van Gestel Dries,John Joachim,Horzel Joerg,Vandervorst Wilfried

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201000306/fullpdf

Reference13 articles.

1. Cross-sectional nano-spreading resistance profiling

2. Conductive diamond tips with sub-nanometer electrical resolution for characterization of nanoelectronics device structures

3. Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling

4. J. Horzel Proceedings of the 25th EPVSEC 2010 1882 1891

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Microscopic origins of radiative performance losses in thin-film solar cells at the example of (Ag,Cu)(In,Ga)Se2 devices;Journal of Vacuum Science & Technology A;2024-01-29

2. Understanding the Origin of Recombination Losses After Co-Plating of Bifacial Solar Cells: In-Depth Microstructure Study;IEEE Journal of Photovoltaics;2021-07

3. Nanoimaging of Open-Circuit Voltage in Photovoltaic Devices;Advanced Energy Materials;2015-09-24

4. On the local conductivity of individual diamond seeds and their impact on the interfacial resistance of boron-doped diamond films;Carbon;2014-11

5. A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications;Journal of Applied Physics;2013-03-21