Evidence of a minimum in refractive indexes of amorphous Ge x Te100−x films: Relevance to the development of infrared waveguides
Author:
Affiliation:
1. ICGM; UMR 5253-CNRS; cc1503, Université Montpellier II, Place Eugène Bataillon, 34095 Montpellier cedex 5 France
2. Thales Alenia Space; 100 bd du Midi, BP99, 06156 Cannes La Bocca cedex France
Publisher
Wiley
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201330407/fullpdf
Reference25 articles.
1. Effect of annealing and temperature on the NO2 sensing properties of tellurium based films
2. Effect of composition on the properties of Te–Ge thick films deposited by co-thermal evaporation
3. Realization of single-mode telluride rib waveguides for mid-IR applications between 10 and 20 μm
4. Optical Properties and Electronic Structure of Amorphous Germanium
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