Investigation of the transition phases from amorphous silicon-based multilayers to silicon nanostructures by in situ X-ray diffraction-Reference-Cited by-同舟云学术

Investigation of the transition phases from amorphous silicon-based multilayers to silicon nanostructures by in situ X-ray diffraction

Published:2014-03-11 Issue:7 Volume:211 Page:1512-1518
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Agbo Solomon¹,Calta Pavel¹,Sutta Pavol¹,Vavrunkova Veronika¹,Netrvalova Marie¹,Prusakova Lucie¹

Affiliation:

1. New Technologies Research Centre; University of West Bohemia; Univerzitni 8 306 14 Pilsen Czech Republic

Funder

EU and Czech Government Sponsorship

ERDF

Ministry of Education, Youth and Sports

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201330231/fullpdf

Reference36 articles.

1. Detailed Balance Limit of Efficiency of p‐n Junction Solar Cells

2. Formation and photoluminescence of Si quantum dots in SiO2/Si3N4 hybrid matrix for all-Si tandem solar cells

3. Phosphorus-doped silicon quantum dots for all-silicon quantum dot tandem solar cells

4. Silicon quantum dot superlattices: Modeling of energy bands, densities of states, and mobilities for silicon tandem solar cell applications

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