Direct Observation of Radical States and the Correlation with Performance Degradation in Organic Light-Emitting Diodes During Device Operation

Author:

Sato Go1,Son Donghyun1,Ito Taisuke1,Osawa Fumiya1,Cho Yujin2,Marumoto Kazuhiro13

Affiliation:

1. Division of Materials Science University of Tsukuba; Tsukuba Ibaraki, 305-8573 Japan

2. Nano Device Characterization Group Nano-Electronics Materials Unit WPI Center for Materials Nanoarchitectonics (MANA) National Institute for Materials Science (NIMS); 1-1 Namiki Tsukuba Ibaraki 305-0044 Japan

3. Tsukuba Research Center for Interdisciplinary Materials Science (TIMS), University of Tsukuba; Tsukuba Ibaraki, 305-8571 Japan

Funder

JSPS KAKENHI

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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