Dielectric characterization based on a printable resonant stub in air and a liquid environment-Reference-Cited by-同舟云学术

Dielectric characterization based on a printable resonant stub in air and a liquid environment

Published:2017-05-15 Issue:9 Volume:214 Page:1700138
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Guerchouche Kamel¹,Herth Etienne²,Calvet Laurie E.²,Roland Nathalie¹,Loyez Christophe¹

Affiliation:

1. IEMN CNRS; UMR 8520, 59650 Villeneuve d' Ascq Cedex France

2. Centre de Nanosciences et de Nanotechnologies, CNRS UMR 9001, Univ. Paris-Sud; Université Paris-Saclay, C2N-Orsay; 91405 Orsay cedex France

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference43 articles.

1. A microwave resonant cavity method for measuring the resistivity of semi-conducting materials

2. The Measurement of Conductivity and Permittivity of Semiconductor Spheres by an Extension of the Cavity Perturbation Method

3. Influence of Waveguide Contact on Measured Complex Permittivity of Semiconductors

4. A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature

5. Y. Kogami H. Tamura K. Matsumura 340 343

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