Imaging Ellipsometry Determination of the Refractive Index Contrast and Dispersion of Channel Waveguides Inscribed by fs-Laser Induced Ion-Migration-Reference-Cited by-同舟云学术

Imaging Ellipsometry Determination of the Refractive Index Contrast and Dispersion of Channel Waveguides Inscribed by fs-Laser Induced Ion-Migration

Published:2018-06-25 Issue:19 Volume:215 Page:1800258
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Moreno-Zarate Pedro¹,Gonzalez Antonio²,Funke Sebastian²,Días Antonio³,Sotillo Belen⁴,del Hoyo Jesus⁵,Garcia-Pardo Marina³,Serna Rosalia³,Fernandez Paloma⁴,Solis Javier³^ORCID

Affiliation:

1. Industrial Engineering School; Tepexi Higher Technological Institute; Tepexi de Rodríguez 74690 Mexico

2. Accurion GmbH; Stresemannstrasse 30 37079 Goettingen Germany

3. Laser Processing Group; Instituto de Óptica; CSIC; Serrano 121 28006 Madrid Spain

4. Faculty of Physics; Department of Materials Physics; University Complutense of Madrid; Madrid 28040 Spain

5. Institute FEMTO-ST; 15B Avenue des Montboucons 25030 Besançon Cedex France

Funder

Spanish Ministry of Economy and Competiveness

CONACYT (México)

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201800258/fullpdf

Reference28 articles.

1. Ion-exchanged glass waveguide technology: a review

2. Determination of Refractive Indices From the Mode Profiles of UV-Written Channel Waveguides in ${\hbox {LiNbO}}_{3}$-Crystals for Optimization of Writing Conditions

3. Characterization Methodologies of Optical Waveguides

4. Application of the Refracted Near-Field Technique to Multimode Planar and Channel Waveguides in Glass

5. Refracted near-field measurements of refractive index and geometry of silica-on-silicon integrated optical waveguides

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