High‐resolution reciprocal space mapping of distributed Bragg reflectors and virtual substrates-Reference-Cited by-同舟云学术

High‐resolution reciprocal space mapping of distributed Bragg reflectors and virtual substrates

Published:2011-10-14 Issue:11 Volume:208 Page:2582-2586
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Zhylik A.¹,Rinaldi F.²,Myronov M.³,Saito K.⁴,Menzel S.²,Dobbie A.³,Leadley D. R.³,Ulyanenkova T.⁵,Feranchuk I. D.¹,Ulyanenkov A.⁶

Affiliation:

1. Department of Theoretical Physics, Belarusian State University, 4 Fr. Skariny av., 220030 Minsk, Republic of Belarus

2. Institut für Optoelektronik, University of Ulm, Albert‐Einstein‐Allee 45, 89081 Ulm, Germany

3. Department of Physics, The University of Warwick, Coventry CV4 7AL, UK

4. Bruker AXS K.K., 3‐9 Moriya, Kanagawa, 221‐0022 Yokohama, Japan

5. University Karlsruhe, Engesserstr. 15, 76131 Karlsruhe, Germany

6. Bruker AXS GmbH, Östliche Rheinbrückenstr. 49, 76187 Karlsruhe, Germany

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.201184260

Reference7 articles.

1. Highly strained Si epilayers grown on SiGe/Si(100) virtual substrate by reduced pressure chemical vapour deposition

2. Strain relaxation in high electron mobility Si1−xGex/Si structures

3. X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films

4. Wide-band x-ray optics with a large angular aperture

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Diffraction from Crystals with Defects;Theoretical Concepts of X-Ray Nanoscale Analysis;2013-09-07