DNA detection with top-down fabricated silicon nanowire transistor arrays in linear operation regime-Reference-Cited by-同舟云学术

DNA detection with top-down fabricated silicon nanowire transistor arrays in linear operation regime

Published:2016-02-29 Issue:6 Volume:213 Page:1510-1519
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Schwartz Miriam¹²,Nguyen Thanh Chien¹²,Vu Xuan Thang¹²³,Weil Maryam¹,Wilhelm Jannick²,Wagner Patrick⁴⁵,Thoelen Ronald⁵,Ingebrandt Sven¹²

Affiliation:

1. Department of Informatics and Microsystem Technology; University of Applied Sciences Kaiserslautern; Amerikastr. 1 66482 Zweibrücken Germany

2. RAM Group DE GmbH; Research Development Center; Amerikastr. 15 66482 Zweibrücken Germany

3. Department of Physics; RWTH Aachen University; Sommerfeldstr. 14 52074 Aachen Germany

4. Department of Physics and Astronomy; Catholic University Leuven; Celestijnenlaan 200d 3001 Leuven Belgium

5. Institute for Materials Research; Hasselt University; Agoralaan Building D 3590 Diepenbeek Belgium

Funder

Federal Ministry of Education and Research

DAAD

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201532919/fullpdf

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5. Direct Detection of the Hybridization of Synthetic Homo-Oligomer DNA Sequences by Field Effect

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