Interface passivation of liquid-phase crystallized silicon on glass studied with high-frequency capacitance-voltage measurements-Reference-Cited by-同舟云学术

Interface passivation of liquid-phase crystallized silicon on glass studied with high-frequency capacitance-voltage measurements

Published:2016-02-25 Issue:7 Volume:213 Page:1697-1704
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Preissler Natalie¹,Töfflinger Jan Amaru²³,Shutsko Ivan¹,Gabriel Onno¹,Calnan Sonya¹,Stannowski Bernd¹,Rech Bernd²,Schlatmann Rutger¹

Affiliation:

1. PVcomB; Helmholtz-Zentrum Berlin für Materialien und Energie; Schwarzschildstr. 3 12489 Berlin Germany

2. Institute for Silicon Photovoltaics; Helmholtz-Zentrum Berlin für Materialien und Energie; Kekuléstr. 5 12489 Berlin Germany

3. Departamento de Ciencias, Sección Física; Pontificia Universidad Católica del Perú; Av. Universitaria 1801 Lima 32 Peru

Funder

Programa Nacional de Innovación para la Competitividad y Productividad - PNICP

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201532957/fullpdf

Reference38 articles.

1. Conversion efficiency and process stability improvement of electron beam crystallized thin film silicon solar cells on glass

2. Intermediate Layer Development for Laser-Crystallized Thin-Film Silicon Solar Cells on Glass

3. Analysis of photo-current potentials and losses in thin film crystalline silicon solar cells

4. Towards monocrystalline silicon thin films grown on glass by liquid phase crystallization

5. Crystalline silicon on glass-interface passivation and absorber material quality

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