Microstructrual evolution of all-wet-processed CIGS films using Raman spectroscopy-Reference-Cited by-同舟云学术

Microstructrual evolution of all-wet-processed CIGS films using Raman spectroscopy

Published:2014-04-22 Issue:8 Volume:211 Page:1877-1881
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Choi Hee Soo¹,Choi Eunmi¹,Kim Areum¹,Yoon Sung Pil²,Pyo Sung Gyu¹

Affiliation:

1. School of Integrative Engineering; Chung-Ang University; 221 Heukseok-Dong Seoul 156-756 Republic of Korea

2. Fuel Cell Research Center; Korea Institute of Science and Technology; Seoul 136-791 Republic of Korea

Funder

Korea Institute of Science & Technology (KIST), Republic of Korea

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201330644/fullpdf

Reference53 articles.

1. Effects of junction parameters on Cu(In,Ga)Se2 solar cells

2. Stability ofn‐i‐pamorphous silicon solar cells

3. Structural, photoelectrical characterization of Cu(InAl)Se2 thin films and the fabrication of Cu(InAl)Se2 based solar cells

4. Development of efficient and stable back contacts on CdTe/CdS solar cells

5. The back contact influence on characteristics of CdTe/CdS solar cells

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