Isothermal crystallization of Ge2Sb2Te5amorphous thin films and estimation of information reliability of PCM cells-Reference-Cited by-同舟云学术

Isothermal crystallization of Ge2Sb2Te5amorphous thin films and estimation of information reliability of PCM cells

Published:2016-03-29 Issue:7 Volume:213 Page:1831-1838
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Kozyukhin S.¹²,Vorobyov Yu.³,Sherchenkov A.⁴,Babich A.⁴,Vishnyakov N.³,Boytsova O.¹

Affiliation:

1. Kurnakov Institute of General and Inorganic Chemistry; RAS, Leninsky Pr., 31 119991 Moscow Russia

2. Department of Chemistry; National Research Tomsk State University; 634050 Tomsk Russia

3. Ryazan State Radio Engineering University; Gagarin St., 59/1 390005 Ryazan Russia

4. National Research University of Electronic Technology; Bld. 5, Pas. 4806 124498 Zelenograd Russia

Funder

Russian Foundation for Basic Research

Tomsk State University Competitiveness Improvement Program

Ministry of Education and Science of Russian Federation

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference47 articles.

1. Reversible Electrical Switching Phenomena in Disordered Structures

2. Phase-Change Optical Storage Media

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5. Phase Change Materials and Their Application to Nonvolatile Memories

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