Characterization of local Al-contacts by light beam induced current measurements and their verification by 2D simulation using flexPDE-Reference-Cited by-同舟云学术

Characterization of local Al-contacts by light beam induced current measurements and their verification by 2D simulation using flexPDE

Published:2016-01-08 Issue:5 Volume:213 Page:1317-1323
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Horbelt Renate¹,Micard Gabriel¹,Keller Philipp¹,Hahn Giso¹,Job Reinhart²,Terheiden Barbara¹

Affiliation:

1. Department of Physics; University of Konstanz; 78457 Konstanz Germany

2. Department of Electron Engineering and Computer Science; Münster University of Applied Sciences; 48565 Steinfurt Germany

Funder

Federal Ministry for the Environment, Nature Conservation and Nuclear Safety

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201532753/fullpdf

Reference35 articles.

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4. Silicon diffusion in aluminum for rear passivated solar cells

5. Diffusion-based model of local Al back surface field formation for industrial passivated emitter and rear cell solar cells

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